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SEMI HB1 — Specifications for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices
SEMI E133-1218 (Reapproved 0324)
SEMI E90-0705 (technical revision)
This Standard establishes implementation practice for the test method of scratch resistance for the surface of FPD polarizing film and cover plastics for mobile displays
F03400 - SEMI F34 - Guide for Liquid Chemical Pipe Labeling Revision:SEMI F34-0618 - Current SEMI HB1 — Specifications forThis Standard was technically approved by the Liquid Chemicals Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on December 13, 2017. Available at www. semiviews. org and www. semi. org in June 2018; originally published in September 1998. This Document establishes a recommended scheme for labeling liquid process chemical piping systems used in semiconductor manufacturing facilities
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