Semiconductor devices. Mechanical and climatic test methods - Acoustic microscopy for plastic encapsulated electronic components best-seller BS EN 165000-1 also applies

Name: Semiconductor devices. Mechanical and climatic test methods - Acoustic microscopy for plastic encapsulated electronic components best-seller BS EN 165000-1 also applies
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Description

BS EN 165000-1 also applies to part completed devices supplied to customers for subsequent processing

It might also be of interest to other organizations

Introduction of revised naming conventions which better match with those found in ITU-T recommendations G

covering measuring capacities from 0 to 300 mm

Semiconductor devices. Mechanical and climatic test methods - Acoustic microscopy for plastic encapsulated electronic components best-seller BS EN 165000-1 also applies

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